The future of optical profiling in Laser Focus World
LFW magazine has published an article by Zemetrics' Director of Optical Engineering, Klaus Freischlad, Ph.D., which highlights the potent new capabilities available in optical profilers that incorporate newly available technologies and engineering, such as 64-bit processing, new high-resolution cameras, and stage previews.
Great news
Now you have two new choices for Optical Profiling Surface Measurement systems. Zemetrics introduces ZeScope Optical Profiler.
Are you ready to have some samples measured? Contact us.
Coming soon to a trade show near you
Zemetrics surface measurement tool demos. Are you going to any shows we should see? Maybe it's already on our calendar. Ask us.
Announcements:
- ZYGO Acquires Zemetrics
- New jobs page -- find it under "Company" above.
- New site content on surface roughness measurements
- Another new product demonstrated at SPIE Optics + Photonics 2009: ZeScope Optical Profiler