The future of optical profiling in Laser Focus World

LFW magazine has published an article by Zemetrics' Director of Optical Engineering, Klaus Freischlad, Ph.D., which highlights the potent new capabilities available in optical profilers that incorporate newly available technologies and engineering, such as 64-bit processing, new high-resolution cameras, and stage previews.

SPIE Photonics West Jan 2010 Exhibition

Zemetrics Booth 4234. Demonstrating ZeScope and ZeMapper surface measurement tools. San Francisco, Jan 26-28. more news...

Applying over 30 years of experience in interferometric metrology, we introduce the ZeMapper surface mapping optical profilometer, fulfilling Zemetrics’ promise to extend the state of the art in optical surface measurement instrumentation. Get more data per measurement, and have high repeatability for 3D surface roughness measurement.

Great news

Now you have two new choices for Optical Profiling Surface Measurement systems. Zemetrics introduces ZeScope Optical Profiler.

Are you ready to have some samples measured? Contact us.

Coming soon to a trade show near you

Zemetrics surface measurement tool demos. Are you going to any shows we should see? Maybe it's already on our calendar. Ask us.