A promising beginning
Zemetrics was formed to provide advanced optical instruments, incorporating the latest technology to users needing precision surface measurements. Established in late 2007, Zemetrics, Inc., introduced its first product line, ZeMapper, in May 2009.
ZeMapper is a top-of-the-line, fully automated, high-resolution optical profilometer like no other. Two months later, ZeMapper was followed by the announcement of ZeScope, a second line of optical profilers, with a massively rigid but open architecture, accommodating large and small sample sizes, which is suitable for a variety of applications. This rapid development cycle—from prototype through engineering, beta, and standardization of complex instruments—is possible through the inspiration, dedication and experience of Zemetrics’ core team.
A strong core
Zemetrics’ leadership are respected innovators in the optical surface metrology industry, and are pioneers in optical, mechanical and software design, enjoying a reputation for finding solutions when no one else can. From a historical perspective, the Zemetrics team were the core scientific, engineering and marketing force at Phase Shift Technology, where they were known for rapid development, quality designs, and responsive applications implementation—skills that among other areas, achieved dominant success in data storage media production measurement and analysis. Providing customer value has been a driving factor in the design philosophy of this team. More than ten years after they produced the MicroXAM Optical Profiler—used for hard disk laser texture analysis and disk-edge duboff characterization—it still has over 200 active installations. They also invented the award-winning OptiFLAT, which remains the de facto standard in disk micro-waviness metrology, based on its sensitive, full-surface imaging and large working distance.
The team has significant experience in the design and production of large system automated capital equipment for the semiconductor wafer manufacturing industry, which became the standard for determining wafer flatness, thickness and nanotopography for modern double-side-polished, 300mm wafer processing factories, winning an R&D100 award.
The Zemetrics technical and management team has had broad success in research and development, production and marketing of reliable, accurate 3D optical surface metrology systems. It is a team of leaders in the field.
Contact Zemetrics Optical Profiling Surface Metrology
- MRS Fall 2009 Exhibitor: Zemetrics Booth 823. Demonstrating ZeMapper and Zescope live. Boston, December 1-3.
- SPIE Photonics West Jan 2010 Exhibition: Zemetrics Booth 4234. Demonstrating ZeScope and ZeMapper surface measurement tools. San Francisco, January 26-28.
- ZeScope Optical Profiler released in July 2009
- ZeMapper Optical Profilometer receives beta customer acceptance
- End of September '09, look for the winner of our "What is it?" drawing
- Get more information about 3D surface roughness Ra metrology